CASE 2018- IEEE International Conference on Automation Science and Engineering

From 20 Aug, 2018 until 24 Aug, 2018
Categories: Conferences

Scope

IEEE CASE 2018 will be held at the Technical University of Munich Campus Garching, Munich, Germany on 20-24 August 2018. The conference will be under the motto Knowledge-based Automation. It will gather experts from academia and industry to report on recent developments, trends and research results. CASE 2018 invites submissions of high-quality research and industry papers describing original and unpublished work.

To allow customized products and shortened time to market on the one hand and longetivity and evolvability of networked automated production systems on the other hand, we need to learn from engineering and operation of systems. CASE 2018 will focus on knowledge as a key factor for future automation engineering and science.

We would also like to encourage representatives from industry to submit interesting papers on their latest developments and work.

Topics of Interest

Cyber physical production systems and industry 4.0

  • Self x-systems,
  • Agents vs. service oriented systems
  • Intelligent products and manufacturing systems
  • Networked control systems
  • Model-coupling and co-Simulation
  • Standardization of interfaces, capabilities, communication, architecture

Cloud computing for automation

Big data and data mining

  • Architecture, pre-prosessing, data-curation, algorithm
  • Application examples: challenges, strength and weaknesses
  • Business models
  • Knowledge acquisition
  • Knowledge modeling (semantic technologies)
  • Knowledge-based engineering assistance

Automation and control

  • Automotive-, manufacturing-, additive manufacturing industry
  • Automation in meso, micro and nano-scale

Mechatronics

Discrete event systems

Model evolution (systems and software)

Human in the loop (in engineering and operation)

Building automation

Important Dates

 

For more information, go to http://www.case2018.org/ 

100% Financial Sponsorship by IEEE RAS

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